Level crossing rate of Nakagami-m fading signal: Field trials and validation

Yacoub, M. D.; Barbin, M. V.; de Castro, M. S.; Vargas, J. E.

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/39479

Title:

Level crossing rate of Nakagami-m fading signal: Field trials and validation

Author(s):

Institution:

Universidade Estadual de Campinas (UNICAMP)
Universidade Estadual Paulista (UNESP)

ISSN:

0013-5194

Abstract:

Field trial measurements are used to validate the level crossing rate formula derived in an exact manner recently for the Nakagami-m signal. The formula reveals an excellent fit to measurements in situations other than those for which the Rice model is more appropriate.

Issue Date:

17-Feb-2000

Citation:

Electronics Letters. Hertford: IEE-inst Elec Eng, v. 36, n. 4, p. 355-357, 2000.

Time Duration:

355-357

Publisher:

Institute of Electrical and Electronics Engineers (IEEE)

Source:

http://dx.doi.org/10.1049/el:20000295

URI:

Access Rights:

Acesso restrito

Type:

outro

Source:

http://repositorio.unesp.br/handle/11449/39479

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