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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/132365
Title: 
Crystallization process of amorphous GaSb films studied by Raman spectroscopy
Author(s): 
Institution: 
  • Universidade Estadual Paulista (UNESP)
  • Universidade Federal de São Carlos (UFSCar)
ISSN: 
0021-8979
Abstract: 
Thermal annealings of amorphous gallium antimonide films were accompanied using Raman spectroscopy, both for stoichiometric and nonstoichiometric compositions. The films were prepared by flash evaporation on silicon substrates. Structural changes were induced by the heat treatments: an increasing degree of crystallization as a function of the annealing temperature is observed. Sb clusters are found to crystallize before GaSb does, and the dependence of the corresponding Raman peak intensity with the annealing temperature (occurring in two regimes) is explained. A mechanism for the crystallization of the amorphous GaSb is proposed, based on the prior migration of the Sb excess outside the GaSb region to be crystallized. © 1995 American Institute of Physics.
Issue Date: 
1-Dec-1995
Citation: 
Journal of Applied Physics, v. 77, n. 8, p. 4044-4048, 1995.
Time Duration: 
4044-4048
Publisher: 
American Institute of Physics (AIP)
Source: 
http://dx.doi.org/10.1063/1.359486
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/132365
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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