Please use this identifier to cite or link to this item:
- Effects of annealing on the crystallization and roughness of PLZT thin films
- Universidade Estadual Paulista (UNESP)
- University of Belgrade
- Lead lanthanum zirconate titanate (PLZT) thin films with stoichiometry (9/65/35) were prepared by a dip-coating process using a polymeric organic solution. The solution viscosity was adjusted in the range of 15-56 cP. Silicon (100) substrates were previously cleaned and then immersed in the solution. The withdrawal speed of substrate from the solution was adjusted within a range of 5 to 20 mm/min. The coated substrates were thermally treated in the 450-700 degreesC temperature range. Surface roughness and crystallization of these films are strongly dependent on the annealing conditions. Infrared and X-ray diffraction data for PLZT powders heat-treated at 650 degreesC for 3 h show that the material is free of carbonate phases and crystalline. (C) 2001 Elsevier B.V. B.V. All rights reserved.
- Thin Solid Films. Lausanne: Elsevier B.V. Sa, v. 384, n. 1, p. 132-137, 2001.
- Elsevier B.V.
- surface roughness
- x-ray diffraction
- Acesso restrito
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.