You are in the accessibility menu

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/36963
Title: 
Surface modifications on Teflon FEP and Mylar C induced by a low energy electron beam: a Raman and FTIR spectroscopic study
Author(s): 
Institution: 
  • Universidade Estadual Paulista (UNESP)
  • Univ Windsor
  • Universidade de São Paulo (USP)
ISSN: 
1058-725X
Abstract: 
The surface modifications induced on Teflon FEP and Mylar C polymer films by a low energy electron beam are probed using Raman and FTIR spectroscopy. The electron beam, which does not affect the Mylar C, surface, may break the copolymer chain into its monomers degrading the Teflon FEP surface. For Mylar C the electron beam decreases the roughness of the polymer surface. This difference in behavior may explain recent results in which the surface modifications investigated by measuring the second crossover energy shift in the electronic emission curve differed for the two polymers (Chinaglia et al [1]). In addition, the Raman data showed no evidence of carbon formation for either polymer samples, which is explained by the fact that only a low energy electron beam is used.
Issue Date: 
1-Jan-2002
Citation: 
Molecular Crystals and Liquid Crystals. Abingdon: Taylor & Francis Ltd, v. 374, p. 577-582, 2002.
Time Duration: 
577-582
Publisher: 
Taylor & Francis Ltd
Keywords: 
  • electron beam irradiation
  • Raman spectroscopy
Source: 
http://dx.doi.org/10.1080/10587250210474
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/36963
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.
 

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.