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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/39949
Title: 
Structural and morphological characterization of Pb1-xBaxTiO3 thin films prepared by chemical route: An investigation of phase transition
Author(s): 
Institution: 
  • Universidade Estadual Paulista (UNESP)
  • Universidade Federal de São Carlos (UFSCar)
ISSN: 
0254-0584
Abstract: 
Detailed room temperature micro-Raman scattering, X-ray diffraction, atomic force microscopy and specular reflectance infrared Fourier transform spectroscopy studies were carried out on soft chemical by processed Pb1-xBaxTiO3 thin films. The micro-Raman spectra pointed the existence of a stable tetragonal ferroelectric phase in the entire composition range (0 < x <= 1). The infrared reflectance spectra showed that the frequency of several peaks decreases as the Ba2+ concentration increases. These features are correlated to a decrease in the tetragonal distortion of the TiO6 octahedra as the Ba2+ concentration increases. Furthermore, as x increases from 0.70 to 1.0, the Raman spectrum shows an evolution towards the well-known Raman spectrum of the tetragonal BaTiO3. Therefore, we demonstrated that the combination of solid solution PbTiO3-BaTiO3 with a grain size in the order of 30-40 nm supports the tetragonal ferroelectric phase at room temperature. (C) 2007 Elsevier B.V. All rights reserved.
Issue Date: 
15-Apr-2008
Citation: 
Materials Chemistry and Physics. Lausanne: Elsevier B.V. Sa, v. 108, n. 2-3, p. 312-318, 2008.
Time Duration: 
312-318
Publisher: 
Elsevier B.V. Sa
Keywords: 
  • thin films
  • chemical synthesis
  • microstructure
  • phase transitions
Source: 
http://dx.doi.org/10.1016/j.matchemphys.2007.10.004
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/39949
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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