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- Título:
- Effect of thermal treatment on the morphology of PLZT thin films prepared from polymeric precursor method
- Universidade Estadual Paulista (UNESP)
- Universidade Federal de São Carlos (UFSCar)
- 1013-9826
- Lead lanthanum zirconate titanate (PLZT) thin films with (9/65/35) stoichiometry were prepared by dip coating from polymeric precursor method. The films deposited on silicon (100) substrates, were thermally treated from 450° to 700°C for 6 hours in order to study the influence of thermal treatment on the crystallinity, microstructure, grain size and roughness of the final film. X-ray diffraction results showed that PLZT phase crystallizes at low temperature (500°C) and present preferential orientation. It was observed by scanning electron microscopy (SEM) that it is possible to obtain dense thin films at temperatures around 650°C. The atomic force microscopy (AFM) studies showed that the grain size and roughness are strongly influenced by the annealing temperature.
- 1-Jan-2001
- Key Engineering Materials, v. 189-191, p. 155-160, 2001.
- 155-160
- Annealing
- Atomic force microscopy
- Crystal microstructure
- Crystal orientation
- Grain size and shape
- Lead compounds
- Scanning electron microscopy
- Stoichiometry
- Surface roughness
- X ray diffraction analysis
- Crystallinity
- Lead lanthanum zirconate titanate
- Thin films
- http://dx.doi.org/10.4028/www.scientific.net/KEM.189-191.155
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- http://repositorio.unesp.br/handle/11449/66434
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