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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/6810
Title: 
Mapping of adhesion forces on soil minerals in air and water by atomic force spectroscopy (AFS)
Author(s): 
Institution: 
  • Empresa Brasileira de Pesquisa Agropecuária (EMBRAPA)
  • Universidade de São Paulo (USP)
  • Universidade Estadual Paulista (UNESP)
ISSN: 
0169-4243
Abstract: 
The adhesion force between an atomic force microscope (AFM) tip and sample surfaces, mica and quartz substrates, was measured in air and water. The force curves show that the adhesion has a strong dependence on both the surface roughness and the environmental conditions surrounding the sample. The variability of the adhesion force was examined in a series of measurements taken at the same point, as well as at different places on the sample surface. The adhesion maps obtained from the distribution of the measured forces indicated regions contaminated by either organic compounds or adsorbed water. Using simple mathematical expressions we could quantitatively predict the adhesion force behavior in both air and water. The experimental results are in good agreement with theoretical calculations, where the adhesion forces in air and water were mostly associated with capillary and van der Waals forces, respectively. A small long-range repulsive force is also observed in water due to the overlapping electrical double-layers formed on both the tip and sample surfaces.
Issue Date: 
1-Jan-2003
Citation: 
Journal of Adhesion Science and Technology. Zeist: Vsp Bv, v. 17, n. 16, p. 2141-2156, 2003.
Time Duration: 
2141-2156
Publisher: 
Vsp Bv
Keywords: 
  • atomic force spectroscopy
  • atomic force microscopy
  • adhesion forces
  • soil minerals
Source: 
http://dx.doi.org/10.1163/156856103772150751
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/6810
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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