You are in the accessibility menu

Please use this identifier to cite or link to this item:
Piezoresponse force microscopy characterization of rare-earth doped BiFeO3 thin films grown by the soft chemical method
Universidade Estadual Paulista (UNESP)
The multiferroic behavior with ion modification using rare-earth cations on crystal structures, along with the insulating properties of BiFeO3 (BFO) thin films was investigated using piezoresponse force microscopy. Rare-earth-substituted BFO films with chemical compositions of (Bi 1.00-xRExFe1.00O3 (x=0; 0.15), RE=La and Nd were fabricated on Pt (111)/Ti/SiO2/Si substrates using a chemical solution deposition technique. A crystalline phase of tetragonal BFO was obtained by heat treatment in ambient atmosphere at 500 °C for 2 h. Ion modification using La3+ and Nd3+ cations lowered the leakage current density of the BFO films at room temperature from approximately 10-6 down to 10-8 A/cm2. The observed improved magnetism of the Nd3+ substituted BFO thin films can be related to the plate-like morphology in a nanometer scale. We observed that various types of domain behavior such as 71° and 180° domain switching, and pinned domain formation occurred. The maximum magnetoelectric coefficient in the longitudinal direction was close to 12 V/cm Oe. © 2012 Elsevier Ltd and Techna Group S.r.l.
Issue Date: 
Ceramics International, v. 39, n. 3, p. 2185-2195, 2013.
Time Duration: 
  • A. Films
  • B. Interfaces
  • C. Dielectric properties
  • C. Ferroelectric properties
  • Ambient atmosphere
  • BFO films
  • Chemical compositions
  • Chemical solution deposition techniques
  • Crystalline phase
  • Domain behavior
  • Domain formation
  • Domain switchings
  • Ferroelectric property
  • Insulating properties
  • Longitudinal direction
  • Magnetoelectric coefficients
  • Multiferroic behavior
  • Nano-meter scale
  • Piezoresponse force microscopy
  • Plate-like morphology
  • Pt(111)
  • Rare earth cations
  • Rare earth doped
  • Room temperature
  • Soft chemical method
  • Bismuth
  • Bismuth compounds
  • Dielectric properties
  • Ferroelectric films
  • Interfaces (materials)
  • Neodymium
  • Platinum
  • Positive ions
  • Thin films
  • Lanthanum
Access Rights: 
Acesso restrito
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.