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Utilize este identificador para citar ou criar um link para este item: http://acervodigital.unesp.br/handle/11449/75611
Título: 
Synthesis of PTSH-modified CeO2 nanoparticles: Effect of the modifier on structure, optical properties, and dispersibility
Autor(es): 
Instituição: 
  • Universidade Estadual Paulista (UNESP)
  • Université d'Orléans
ISSN: 
  • 0927-7757
  • 1873-4359
Resumo: 
CeO2 nanoparticles were synthesized by the precipitation method and modified with para-toluene sulfonic acid (PTSH), either in situ or post-synthesis. The presence of PTSH in the samples was confirmed by FTIR. PXRD and FTIR analyses showed that the post-synthesis PTSH modification altered the CeO2 structure, whereas the in situ modification maintained intact the crystalline structure and UV-vis absorbance properties. For both in situ and post-synthesis modifications, TEM images revealed the presence of nanoparticles that were 5nm in size. The dispersibility of the in situ PTSH-modified material in a hydrophilic ureasil-poly(ethylene oxide) matrix was investigated using SAXS measurements, which indicated that CeO2 nanoparticles modified with PTSH in situ were less aggregated within the matrix, compared to unmodified CeO2 nanoparticles. © 2013 Elsevier B.V.
Data de publicação: 
5-Jun-2013
Citação: 
Colloids and Surfaces A: Physicochemical and Engineering Aspects, v. 426, p. 63-69.
Duração: 
63-69
Palavras-chaves: 
  • CeO2 nanoparticles
  • Dispersibility
  • Surface modification
  • Crystalline structure
  • Dispersibilities
  • Ethylene oxides
  • FTIR analysis
  • Post-synthesis modification
  • Precipitation methods
  • Situ modification
  • UV-vis absorbance
  • Nanoparticles
  • Optical properties
  • Polyethylene oxides
  • Precipitation (chemical)
  • Surface treatment
  • Synthesis (chemical)
  • 4 toluene sulfonic acid
  • cerium oxide
  • macrogol
  • nanoparticle
  • sulfonic acid derivative
  • titanium dioxide
  • toluene
  • unclassified drug
  • infrared spectroscopy
  • priority journal
  • synthesis
  • transmission electron microscopy
  • ultraviolet radiation
Fonte: 
http://dx.doi.org/10.1016/j.colsurfa.2013.03.011
Endereço permanente: 
Direitos de acesso: 
Acesso restrito
Tipo: 
outro
Fonte completa:
http://repositorio.unesp.br/handle/11449/75611
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