You are in the accessibility menu

Search


Current filters:
Start a new search
Add filters:

Use filters to refine the search results.

 | 
Results 1-10 of 43.
Item hits:
Recent Submissions
Issue DateTypeTitleContributhor(s)
5-Aug-2009outroEffect of annealing atmosphere on phase formation and electrical characteristics of bismuth ferrite thin filmsSimões, Alexandre Zirpoli;Riccardi, C. S.;Dos Santos, M. L.;Garcia, F. Gonzalez;Longo, Elson;Varela, José Arana
1-Aug-2013outroMicrocantilever chaotic motion suppression in tapping mode atomic force microscopeBalthazar, José Manoel;Tusset, Angelo Marcelo;De Souza, Silvio Luiz Thomaz;Bueno, Atila Madureira
21-Aug-2013outroEumelanin thin films: Solution-processing, growth, and charge transport propertiesWünsche, Julia;Cicoira, Fabio;Graeff, Carlos Frederico de Oliveira;Santato, Clara
1-Sep-2013outroStructural transition of ZnO thin films produced by RF magnetron sputtering at low temperaturesRosa, A. M.;Da Silva, E. P.;Chaves, M.;Trino, L. D.;Lisboa Filho, Paulo Noronha;Da Silva, T. F.;Durrant, S. F.;Bortoleto, J. R R
1-Sep-2013outroStructural and electrical properties of LaNiO3 thin films grown on (100) and (001) oriented SrLaAlO4 substrates by chemical solution deposition methodPontes, D. S L;Pontes, F. M.;Pereira-Da-Silva, Marcelo A.;Berengue, O. M.;Chiquito, A. J.;Longo, Elson
1-Sep-2013outroOptical, mechanical and surface properties of amorphous carbonaceous thin films obtained by plasma enhanced chemical vapor deposition and plasma immersion ion implantation and depositionTurri, Rafael G.;Santos, Ricardo M.;Rangel, Elidiane Cipriano;Cruz, Nilson Cristino da;Bortoleto, José R.R.;Dias Da Silva, José H.;Antonio, César Augusto;Durrant, Steven Frederick
1-Jul-2013outroTuning the nanostructure of DODAB/nickel tetrasulfonated phthalocyanine bilayers in LbL filmsFurini, L. N.;Feitosa, E.;Alessio, P.;Shimabukuro, M. H.;Riul, A.;Constantino, C. J L
15-Feb-2013outroInterface formation of nanostructured heterojunction SnO 2:Eu/GaAs and electronic transport propertiesPineiz, Tatiane F.;De Morais, Evandro A.;Scalvi, Luis V.A.;Bueno, Cristina F.
1-Jun-2013outroNonlinear control system applied to atomic force microscope including parametric errorsNozaki, Ricardo;Balthazar, José Manoel;Tusset, Angelo Marcelo;De Pontes Jr., Bento Rodrigues;Bueno, Átila Madureira
1-May-2013outroA brief discussion about image quality and SEM methods for quantitative fractography of polymer compositesHein, L. R O;Campos, K. A.;Caltabiano, P. C R O;Kostov, K. G.