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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/113647
Title: 
Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films
Author(s): 
Institution: 
  • Universidade Federal do Tocantins (UFT)
  • Universidade Estadual Paulista (UNESP)
  • Univ Aveiro
ISSN: 
0015-0193
Sponsorship: 
  • Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
  • Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
  • Center for Research on Ceramic and Composite materials (CICECO) of the University of Aveiro
Sponsorship Process Number: 
  • FAPESP: 13/12642-7
  • FAPESP: 10/16504-0
  • FAPESP: 07/08534-3
  • CNPq: 305973/2012-6
  • Center for Research on Ceramic and Composite materials (CICECO) of the University of AveiroPEst-C/CTM/LA0011/2013
Abstract: 
PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena.
Issue Date: 
11-Jun-2014
Citation: 
Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 465, n. 1, p. 106-114, 2014.
Time Duration: 
106-114
Publisher: 
Taylor & Francis Ltd
Keywords: 
  • Piezoelectric
  • piezoresponse
  • self-polarization
Source: 
http://dx.doi.org/10.1080/00150193.2014.894391
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/113647
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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