Please use this identifier to cite or link to this item:
http://acervodigital.unesp.br/handle/11449/113647
- Title:
- Effect of Composition on the Physical Properties at Nanoscale of PZT Thin Films
- Universidade Federal do Tocantins (UFT)
- Universidade Estadual Paulista (UNESP)
- Univ Aveiro
- 0015-0193
- Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
- Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
- Center for Research on Ceramic and Composite materials (CICECO) of the University of Aveiro
- FAPESP: 13/12642-7
- FAPESP: 10/16504-0
- FAPESP: 07/08534-3
- CNPq: 305973/2012-6
- Center for Research on Ceramic and Composite materials (CICECO) of the University of AveiroPEst-C/CTM/LA0011/2013
- PbZr1-xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena.
- 11-Jun-2014
- Ferroelectrics. Abingdon: Taylor & Francis Ltd, v. 465, n. 1, p. 106-114, 2014.
- 106-114
- Taylor & Francis Ltd
- Piezoelectric
- piezoresponse
- self-polarization
- http://dx.doi.org/10.1080/00150193.2014.894391
- Acesso restrito
- outro
- http://repositorio.unesp.br/handle/11449/113647
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