Electrical behavior analysis of n-type CaCu3Ti4O12 thick films exposed to different atmospheres

Ponce, M. A.; Ramirez Gil, Miguel Angel; Schipani, F.; Joanni, E.; Tomba, J. P.; Castro, M. S.

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/116600

Title:

Electrical behavior analysis of n-type CaCu3Ti4O12 thick films exposed to different atmospheres

Author(s):

Institution:

Univ Mar del Plata UNMdP
Universidade Estadual Paulista (UNESP)
CTI Renato Archer

ISSN:

0955-2219

Sponsorship:

ANPCyT (Agencia Nacional de Promocion Cientifica y Tecnologica, Argentina)
Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)

Abstract:

In this work n-type CaCu3Ti4O12 (CCTO) thick films obtained by screen printing were studied. The role of the potential barrier characteristics (height and width) was considered in order to explain the electrical behavior. The electrical response was also analyzed considering the oxygen adsorption and subsequent diffusion into the grains at temperatures higher than 280 degrees C. Tunnel currents were also calculated taking into account the donor concentration values for films in vacuum atmosphere. Published by Elsevier Ltd.

Issue Date:

1-Jan-2015

Citation:

Journal Of The European Ceramic Society. Oxford: Elsevier Sci Ltd, v. 35, n. 1, p. 153-161, 2015.

Time Duration:

153-161

Publisher:

Elsevier B.V.

Keywords:

Semiconductor
Conduction mechanism
CaCu3Ti4O12
Diffusion

Source:

http://dx.doi.org/10.1016/j.jeurceramsoc.2014.08.041

URI:

Access Rights:

Acesso restrito

Type:

outro

Source:

http://repositorio.unesp.br/handle/11449/116600

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