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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/116655
Title: 
Effect of Fe-doping on the structural, microstructural, optical, and ferroeletric properties of Pb1/2Sr1/2Ti1-xFexO3 oxide prepared by spin coating technique
Author(s): 
Institution: 
  • Universidade Estadual Paulista (UNESP)
  • Universidade Federal de São Carlos (UFSCar)
  • Universidade de São Paulo (USP)
  • UNICEP
ISSN: 
0167-577X
Sponsorship: 
  • Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
  • INCTMN
  • Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
Sponsorship Process Number: 
  • FAPESP: 08/57150-6
  • FAPESP: 11/20536-7
  • FAPESP: 12/14106-2
  • FAPESP: 13/07296-2
  • INCTMN08/57872-1
  • CNPq: 573636/2008-7
Abstract: 
The influence of Fe content on the structural, microstructural, dielectric, ferroelectric and optical properties was investigated in Pb1/2Sr1/2Ti1-xFexO3 films deposited on Si/SiO2/Ti/Pt and quartz substrates. X-ray diffraction showed that all films presented polycrystalline and single perovskite phases and the change of lattice parameters caused by increasing Fe-doping content replacing Ti4+ ions is very small to be detected by X-ray diffraction technique. Micro-Raman analysis showed the tetragonal nature for both undoped-PSTF and cloped-PSTF (1%Fe) films, while both cloped-PSTF (5%Fe) and PSIT-10 (10%Fe) films presented a pseudocubic structure. It was noticed that all films exhibited a homogeneous microstructure, compact and crack-free. The remnant polarization in the Fe-doped PSTF films was weaker than that for undoped-PSTF films which was attributed to structural changes and smaller grain size. The increasing of Fe content leads to a red shifted band gap relative to undoped PSTF films due localized levels within the forbidden band of PSTF. (C) 2014 Elsevier BM. All rights reserved.
Issue Date: 
1-Jan-2015
Citation: 
Materials Letters. Amsterdam: Elsevier Science Bv, v. 138, p. 179-183, 2015.
Time Duration: 
179-183
Publisher: 
Elsevier B.V.
Keywords: 
  • Thin films
  • Ferroelectric properties
  • Optical properties
  • AFM
  • Perovskite
Source: 
http://dx.doi.org/10.1016/j.matlet.2014.10.005
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/116655
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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