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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/129779
Title: 
Supervised variational relevance learning, an analytic geometric feature selection with applications to omic datasets
Author(s): 
Institution: 
  • Universidade de São Paulo (USP)
  • Universidade Estadual Paulista (UNESP)
ISSN: 
1545-5963
Sponsorship: 
  • Center for the Study of Natural and Artificial Information Processing Systems of the University of Sao Paulo (CNAIPS, Nucleo de Apoio a Pesquisa da Universidade de Sao Paulo)
  • Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
  • Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
Abstract: 
We introduce Supervised Variational Relevance Learning (Suvrel), a variational method to determine metric tensors to define distance based similarity in pattern classification, inspired in relevance learning. The variational method is applied to a cost function that penalizes large intraclass distances and favors small interclass distances. We find analytically the metric tensor that minimizes the cost function. Preprocessing the patterns by doing linear transformations using the metric tensor yields a dataset which can be more efficiently classified. We test our methods using publicly available datasets, for some standard classifiers. Among these datasets, two were tested by the MAQC-II project and, even without the use of further preprocessing, our results improve on their performance.
Issue Date: 
1-May-2015
Citation: 
Ieee-acm Transactions On Computational Biology And Bioinformatics. Los Alamitos: Ieee Computer Soc, v. 12, n. 3, p. 705-711, 2015.
Time Duration: 
705-711
Publisher: 
Ieee Computer Soc
Keywords: 
  • Suvrel
  • Relevance Learning
  • Analytic metric learning
  • Proteomics
  • Metabolomics
  • Genomics
  • Feature selection
  • Distance learning
Source: 
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6977958
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/129779
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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