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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/25029
Title: 
Theoretical Models for Surface Forces and Adhesion and Their Measurement Using Atomic Force Microscopy
Author(s): 
Institution: 
  • Universidade Federal de São Carlos (UFSCar)
  • Universidade Estadual Paulista (UNESP)
  • Universidade de São Paulo (USP)
ISSN: 
1422-0067
Sponsorship: 
  • Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)
  • Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)
  • Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)
Sponsorship Process Number: 
  • FAPESP: 07/05089-9
  • CNPq: 483303/2011-9
  • CAPES: 02880/09-1
Abstract: 
The increasing importance of studies on soft matter and their impact on new technologies, including those associated with nanotechnology, has brought intermolecular and surface forces to the forefront of physics and materials science, for these are the prevailing forces in micro and nanosystems. With experimental methods such as the atomic force spectroscopy (AFS), it is now possible to measure these forces accurately, in addition to providing information on local material properties such as elasticity, hardness and adhesion. This review provides the theoretical and experimental background of AFS, adhesion forces, intermolecular interactions and surface forces in air, vacuum and in solution.
Issue Date: 
1-Oct-2012
Citation: 
International Journal of Molecular Sciences. Basel: Mdpi Ag, v. 13, n. 10, p. 12773-12856, 2012.
Time Duration: 
12773-12856
Publisher: 
Mdpi Ag
Keywords: 
  • van der Waals
  • adhesion
  • surface forces
  • atomic force microscopy
  • atomic force spectroscopy
  • structural forces
  • double-layer
  • wettability
  • AFM
Source: 
http://dx.doi.org/10.3390/ijms131012773
URI: 
Access Rights: 
Acesso aberto
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/25029
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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