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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/25423
Title: 
Influence of thickness on crystallization and properties of LiNbO3 thin films
Author(s): 
Institution: 
  • Universidade Estadual Paulista (UNESP)
  • University of Belgrade
ISSN: 
1044-5803
Abstract: 
Thin films of lithium niobate were deposited on Pt/Ti/SiO2 (111) substrates by spin coating from the polymeric precursor method (Pechini process). Annealing in static air was performed at 500 degreesC for 3 h. The obtained films were characterized by X-ray diffraction and atomic force microscopy. The dielectric constant, dissipation factor and resistance were measured in frequency region from 10 Hz to 10 MHz and the hysteresis loop was obtained. The influence of number of layers on crystallization, morphology and properties of LiNbO3 thin films is discussed. (C) 2003 Elsevier B.V. All rights reserved.
Issue Date: 
1-Mar-2003
Citation: 
Materials Characterization. New York: Elsevier B.V., v. 50, n. 2-3, p. 239-244, 2003.
Time Duration: 
239-244
Publisher: 
Elsevier B.V.
Keywords: 
  • LiNbO3
  • crystallization
  • electrical properties
Source: 
http://dx.doi.org/10.1016/S1044-5803(03)00089-5
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/25423
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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