Spectroscopic characterization of BPSCCO thin films grown by dip-coating technique

Carvalho, C. L.; Guedes, I

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/33613

Title:

Spectroscopic characterization of BPSCCO thin films grown by dip-coating technique

Author(s):

Institution:

Universidade Federal do Ceará (UFC)
Universidade Estadual Paulista (UNESP)

ISSN:

0921-4534

Abstract:

This work describes the growth of Bi2-xPbxSr2Can-1CunO2n+4 thin films by the dip-coating technique for 0.4 less than or equal to x less than or equal to 1. X-ray and Raman spectroscopic techniques were carried out in order to characterize the films at room temperature. From X-ray data it is observed that the films are multi-phased presenting phases 2201, 2212 and 2223 along with the undesirable Ca2PbO4 phase. It is also observed that phase 2212 becomes dominant when Pb content increases. The Raman modes observed agree with the overall features expected for these compounds. (C) 2003 Elsevier B.V. B.V. All rights reserved.

Issue Date:

1-Jul-2003

Citation:

Physica C-superconductivity and Its Applications. Amsterdam: Elsevier B.V., v. 390, n. 3, p. 239-242, 2003.

Time Duration:

239-242

Publisher:

Elsevier B.V.

Keywords:

BPSSCO thin films
dip-coating technique
X-ray diffraction
Raman scattering

Source:

http://dx.doi.org/10.1016/S0921-4534(03)00701-9

URI:

Access Rights:

Acesso restrito

Type:

outro

Source:

http://repositorio.unesp.br/handle/11449/33613

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