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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/34659
Title: 
X charts with supplementary samples to control the mean and variance
Author(s): 
Costa, AFB
Institution: 
Universidade Estadual Paulista (UNESP)
ISSN: 
0020-7543
Abstract: 
A standard X chart for controlling a process takes regular individual observations, for instance every half hour. This article proposes a modification of the X chart that allows one to take supplementary samples. The supplementary sample is taken (and the (X) over bar and R values computed) when the current value of X falls outside the control limits. With the supplementary sample, the signal of out-of-control is given by an (X) over bar value outside the (X) over bar chart's control limits or an R value outside the R chart's control limit. The proposed chart is designed to hold the supplementary sample frequency, during the in-control period, as low as 5% or less. In this context, the practitioner might prefer to verify an out-of-control condition by simply comparing the (X) over bar and R values with the control limits. In other words, without plotting the (X) over bar and R points. The X chart with supplementary samples has two major advantages when compared with the standard (X) over bar and A charts: (a) the user will be plotting X values instead of (X) over bar and R values; (b) the shifts in the process mean and/or changes in the process variance are detected faster.
Issue Date: 
10-Nov-2000
Citation: 
International Journal of Production Research. London: Taylor & Francis Ltd, v. 38, n. 16, p. 3801-3809, 2000.
Time Duration: 
3801-3809
Publisher: 
Taylor & Francis Ltd
Source: 
http://dx.doi.org/10.1080/00207540050176012
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/34659
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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