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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/36533
Title: 
Poole-Frenkel effect in Er doped SnO2 thin films deposited by sol-gel-dip-coating
Author(s): 
Institution: 
  • Universidade Estadual Paulista (UNESP)
  • Universidade de São Paulo (USP)
ISSN: 
0031-8965
Abstract: 
Electrical properties of Er-doped SnO2 thin films obtained by sol-gel-dip-coating technique were measured. When compared to undoped tin dioxide, rare-earth doped films present much higher resistivity, indicating that Er3+ presents an acceptor-like character into the matrix, which leads to a high degree of electric charge compensation. Current-voltage characteristics, measured above room temperature for Er-doped films, lead to non-linear behavior and two conduction regimes. In the lower electric field range the conduction is dominated by Schottky emission over the grain boundary potential barrier, which presents an average value of 0.85 eV. Increasing the applied bias, a second regime of conduction is observed, since the Poole-Frenkel coulombic barrier lowering becomes a significant effect. The obtained activation energy for ionization is 0.67 eV. (C) 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Issue Date: 
1-Jan-2005
Citation: 
Physica Status Solidi A-applied Research. Weinheim: Wiley-v C H Verlag Gmbh, v. 202, n. 2, p. 301-308, 2005.
Time Duration: 
301-308
Publisher: 
Wiley-Blackwell
Source: 
http://dx.doi.org/10.1002/pssa.200406919
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/36533
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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