Fatigue-free behavior of Bi3.25La0.75Ti3O12 thin films grown on several bottom eletrodes by the polymeric precursor method

Simoes, A. Z.; Ries, A.; Filho, F. M.; Riccardi, C. S.; Varela, José Arana; Longo, Elson

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/37253

Title:

Fatigue-free behavior of Bi3.25La0.75Ti3O12 thin films grown on several bottom eletrodes by the polymeric precursor method

Author(s):

Institution:

Universidade Estadual Paulista (UNESP)
Universidade Federal de São Carlos (UFSCar)

ISSN:

0003-6951

Abstract:

Fatigue-free Bi3.25La0.75Ti3O12 (BLT) thin films were grown on LaNiO3,RuO2, and La0.5Sr0.5CoO3 bottom electrodes in a microwave furnace at 700 degreesC for 10 min. The remanent polarization (P-r) and the drive voltage (V-c) were in the range of 11-23 muC/cm(2) and 0.86-1.56 V, respectively, and are better than the values found in the literature. The BLT capacitors did not show any significant fatigue up to 10(10) read/write switching cycles. (C) 2004 American Institute of Physics.

Issue Date:

13-Dec-2004

Citation:

Applied Physics Letters. Melville: Amer Inst Physics, v. 85, n. 24, p. 5962-5964, 2004.

Time Duration:

5962-5964

Publisher:

American Institute of Physics (AIP)

Source:

http://dx.doi.org/10.1063/1.1834999

URI:

Access Rights:

Acesso restrito

Type:

outro

Source:

http://repositorio.unesp.br/handle/11449/37253

Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.

Show full item record View Statistics