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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/38280
Title: 
The failure analyses on ZnO varistors used in high tension devices
Author(s): 
Institution: 
  • Natl Univ Colombia
  • Universidade Estadual Paulista (UNESP)
ISSN: 
0022-2461
Abstract: 
The main purpose of this work is to evaluate the failure caused by electrical discharge on commercial ZnO varistor doped with oxide of Bi, Sb, Si, Cr, Co utilized in electric transmission systems. In order to observe the effect of electrical discharge over the microstructure and electrical properties of the varistors, two kinds of pulses were applied: long pulse (2000 ms) and short pulse (8/20 mu s). In both cases, a decrease in grain size and increase in micropores and leakage current were observed. The degraded samples present oxygen defficiency mainly in the grain boundary and phase tranformation from the bismuth oxide phase. (c) 2005 Springer Science+ Business Media, Inc.
Issue Date: 
1-Nov-2005
Citation: 
Journal of Materials Science. Dordrecht: Springer, v. 40, n. 21, p. 5591-5596, 2005.
Time Duration: 
5591-5596
Publisher: 
Springer
Source: 
http://dx.doi.org/10.1007/s10853-005-1366-4
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/38280
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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