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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/40841
Title: 
Bayesian outlier analysis in binary regression
Author(s): 
Institution: 
  • Universidade Estadual Paulista (UNESP)
  • Universidade Federal do Rio de Janeiro (UFRJ)
ISSN: 
0266-4763
Abstract: 
We propose alternative approaches to analyze residuals in binary regression models based on random effect components. Our preferred model does not depend upon any tuning parameter, being completely automatic. Although the focus is mainly on accommodation of outliers, the proposed methodology is also able to detect them. Our approach consists of evaluating the posterior distribution of random effects included in the linear predictor. The evaluation of the posterior distributions of interest involves cumbersome integration, which is easily dealt with through stochastic simulation methods. We also discuss different specifications of prior distributions for the random effects. The potential of these strategies is compared in a real data set. The main finding is that the inclusion of extra variability accommodates the outliers, improving the adjustment of the model substantially, besides correctly indicating the possible outliers.
Issue Date: 
1-Jan-2010
Citation: 
Journal of Applied Statistics. Abingdon: Routledge Journals, Taylor & Francis Ltd, v. 37, n. 8, p. 1355-1368, 2010.
Time Duration: 
1355-1368
Publisher: 
Routledge Journals, Taylor & Francis Ltd
Keywords: 
  • binary regression models
  • Bayesian residual
  • random effect
  • mixture of normals
  • Markov chain Monte Carlo
Source: 
http://dx.doi.org/10.1080/02664760903031153
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/40841
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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