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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/41782
Title: 
The Variable Sample Size (X)over-bar Chart with Estimated Parameters
Author(s): 
Institution: 
  • Univ Nantes
  • IRCCyN UMR CNRS 6597
  • Ecole Cent Nantes
  • Wuhan Univ Technol
  • Universidade Estadual Paulista (UNESP)
  • Univ Aegean
ISSN: 
0748-8017
Abstract: 
The VSS X chart, dedicated to the detection of small to moderate mean shifts in the process, has been investigated by several researchers under the assumption of known process parameters. In practice, the process parameters are rarely known and are usually estimated from an in-control Phase I data set. In this paper, we evaluate the (run length) performances of the VSS chart when the process parameters are estimated, we compare them in the case where the process parameters are assumed known and we propose specific optimal control chart parameters taking the number of Phase I samples into account.
Issue Date: 
1-Nov-2012
Citation: 
Quality and Reliability Engineering International. Hoboken: Wiley-blackwell, v. 28, n. 7, p. 687-699, 2012.
Time Duration: 
687-699
Publisher: 
Wiley-Blackwell
Keywords: 
  • (X)over-bar chart
  • adaptative chart
  • estimated parameter
  • run length
Source: 
http://dx.doi.org/10.1002/qre.1261
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/41782
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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