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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/42192
Title: 
Refractive and geometric lens characterization through multi-wavelength digital speckle pattern interferometry
Author(s): 
Institution: 
Universidade Estadual Paulista (UNESP)
ISSN: 
0030-4018
Abstract: 
Physical parameters of different types of lenses were measured through digital speckle pattern interferometry (DSPI) using a multimode diode laser as light source. When such lasers emit two or more longitudinal modes simultaneously the speckle image of an object appears covered of contour fringes. By performing the quantitative fringe evaluation the radii of curvature as well as the refractive indexes of the lenses were determined. The fringe quantitative evaluation was carried out through the four- and the eight-stepping techniques and the branch-cut method was employed for phase unwrapping. With all these parameters the focal length was calculated. This whole-field multi-wavelength method does enable the characterization of spherical and aspherical lenses and of positive and negative ones as well. (C) 2007 Elsevier B.V. All rights reserved.
Issue Date: 
1-Mar-2008
Citation: 
Optics Communications. Amsterdam: Elsevier B.V., v. 281, n. 5, p. 1022-1029, 2008.
Time Duration: 
1022-1029
Publisher: 
Elsevier B.V.
Keywords: 
  • speckle
  • DSPL synthetic wavelength
  • lens measurement
Source: 
http://dx.doi.org/10.1016/j.optcom.2007.10.077
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/42192
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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