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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/65803
Title: 
Influence of heat treatment on LiNbO3 thin films prepared on Si(111) by the polymeric precursor method
Author(s): 
Institution: 
  • Universidade Federal de São Carlos (UFSCar)
  • Universidade Estadual Paulista (UNESP)
ISSN: 
0884-2914
Abstract: 
The effects of heat-treatment temperature on LiNbO3 thin films prepared by the polymeric precursor method were investigated. The precursor solution was deposited on Si(111) substrates by dip coating. X-ray diffraction and thermal analyses revealed that the crystallization process occurred at a low temperature (420 °C) and led to films with no preferential orientation. High-temperature treatments promoted formation of the LiNb3O8 phase. Scanning electron microscopy, coupled with energy dispersive spectroscopy analyses, showed that the treatment temperature also affected the film microstructure. The surface texture - homogeneous, smooth, and pore-free at low temperature - turned into an `islandlike' microstructure for high-temperature treatments.
Issue Date: 
1-Jul-1999
Citation: 
Journal of Materials Research, v. 14, n. 7, p. 3115-3121, 1999.
Time Duration: 
3115-3121
Keywords: 
  • Crystal microstructure
  • Crystal orientation
  • Crystallization
  • Ferroelectric materials
  • Film preparation
  • Heat treatment
  • Lithium niobate
  • Piezoelectric materials
  • Silicon wafers
  • Surface structure
  • Thermal effects
  • Thin films
  • Polymeric precursor method
  • Dielectric films
Source: 
http://dx.doi.org/10.1557/JMR.1999.0418
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/65803
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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