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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/67805
Title: 
Nucleation and crystallization of titania nanoparticles in silica titania planar waveguides: A study by low frequency Raman scattering
Author(s): 
Institution: 
  • Università di Trento
  • Istituto Di Fotonica E Nanotecnologie (IFN)
  • Universidade Estadual Paulista (UNESP)
  • Università di Padova
  • Rudjer Boskovic Institute
ISSN: 
0255-5476
Abstract: 
SiO2 (1-x) - TiO2 (x) waveguides, with the mole fraction x in the range 0.07 - 0.20 and thickness of about 0.4 μm, were deposited on silica substrates by a dip-coating technique. The thermal treatments at 700-900°C, used to fully densify the xerogels, produce nucleation of TiO2 nanocrystals even for the lowest TiO2 content. The nucleation of TiO2 nanocrystals and their growth by thermal annealing up to 1300°C were studied by waveguide Raman spectroscopy, for the SiO2 (0.8) - TiO2 (0.2) composition. By increasing the annealing temperature, the Raman spectrum evolves from that typical of the silica-titania glass to that of anatase, but brookite phase is dominant at intermediate temperatures. In the low. frequency region (5-50 cm-1) of the Raman spectra, acoustic vibrations of the nanocrystals are observed. From the measured line shapes, we can deduce the size distribution of the particles. The results are compared with those obtained from the line widths in the X-ray diffraction patterns. Nanocrystals with a mean size in the range 4-20 nm are obtained, by thermal annealing in a corresponding range of 800-1300°C.
Issue Date: 
28-Jul-2004
Citation: 
Materials Science Forum, v. 455-456, p. 520-526, 2004.
Time Duration: 
520-526
Keywords: 
  • Glass-ceramics
  • Nanocrystals
  • Raman
  • Sol-gel
  • Waveguides
  • Devitrification
  • Mole fraction
  • Planar waveguides
  • Annealing
  • Composition
  • Crystallization
  • Density (specific gravity)
  • Nucleation
  • Particle size analysis
  • Raman scattering
  • Sol-gels
  • Substrates
  • Titanium dioxide
  • X ray diffraction
  • Nanostructured materials
Source: 
http://dx.doi.org/10.4028/www.scientific.net/MSF.455-456.520
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/67805
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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