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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/69820
Title: 
Strain relaxation and stress-driven interdiffusion in InAsInGaAsInP nanowires
Author(s): 
Institution: 
  • Universidade Estadual de Campinas (UNICAMP)
  • Universidade Federal de Minas Gerais (UFMG)
  • Pennsylvania State University
  • Universidade Estadual Paulista (UNESP)
ISSN: 
0003-6951
Abstract: 
The authors have investigated strain relaxation in InAsInGaAsInP nanowires (NW's). Transmission electron microscopy images show an additional stress field attributed to compositional modulation in the ternary layer, which disrupts NW formation and drives Ga interdiffusion into InAs, according to grazing incidence x-Ray diffraction under anomalous scattering conditions. The strain profile along the NW, however, is not significantly affected when interdiffusion is considered. Results show that the InAs NW energetic stability is preserved with the introduction of ternary buffer layer in the structure. © 2007 American Institute of Physics.
Issue Date: 
17-Aug-2007
Citation: 
Applied Physics Letters, v. 91, n. 6, 2007.
Keywords: 
  • Diffusion
  • Indium compounds
  • Strain relaxation
  • Transmission electron microscopy
  • X ray diffraction
  • Compositional modulation
  • Stress driven interdiffusion
  • Stress fields
  • Ternary layers
  • Nanowires
Source: 
http://dx.doi.org/10.1063/1.2764446
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/69820
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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