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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/71250
Title: 
Construction and test of low cost X-ray tomography scanner for physical-chemical analysis and nondestructive inspections
Author(s): 
Institution: 
  • Universidade de Sorocaba - UNISO
  • Universidade Estadual Paulista (UNESP)
ISSN: 
  • 0094-243X
  • 1551-7616
Abstract: 
X-ray computed tomography (CT) refers to the cross-sectional imaging of an object measuring the transmitted radiation at different directions. In this work, we describe the development of a low cost micro-CT X-ray scanner that is being developed for nondestructive testing. This tomograph operates using a microfocus X-ray source and contains a silicon photodiode as detectors. The performance of the system, by its spatial resolution, has been estimated through its Modulation Transfer Function - MTF and the obtained value at 10% of MTF is 661 μm. It was built as a general purpose nondestructive testing device. © 2009 American Institute of Physics.
Issue Date: 
27-Nov-2009
Citation: 
AIP Conference Proceedings, v. 1139, p. 102-105.
Time Duration: 
102-105
Keywords: 
  • Image analysis
  • Nondestructive inspections
  • Tomography
  • X-ray
Source: 
http://dx.doi.org/10.1063/1.3157786
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/71250
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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