You are in the accessibility menu

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/73842
Title: 
Study of the influence of the rare earth elements (Ce3+ and Ce4+) concentration on the siloxanes coating applied on the copper surface
Author(s): 
Institution: 
  • Universidade Federal da Grande Dourados (UFGD)
  • Universidade de São Paulo (USP)
  • Universidade Estadual Paulista (UNESP)
ISSN: 
  • 1938-5862
  • 1938-6737
Abstract: 
This work studied the influence of the rare earth (Ce3+ and Ce4+) elements concentration in polysiloxane flints deposited on copper by dip-coating process, and evaluated their resistance in a 3.5 wt.% NaCl medium. Classical electrochemistry techniques were used as open circuit potential, polarization curves and electrochemical impedance spectroscopy. The results revealed that by adding low concentration of Ce4+ ions, the coating prevents the electrolyte uptake any longer retarding the substrate degradation consequently. ©The Electrochemical Society.
Issue Date: 
1-Dec-2012
Citation: 
ECS Transactions, v. 43, n. 1, p. 3-7, 2012.
Time Duration: 
3-7
Keywords: 
  • Copper surface
  • Dip-coating process
  • Low concentrations
  • Open circuit potential
  • Polarization curves
  • Substrate degradation
  • Copper
  • Degradation
  • Electrochemical impedance spectroscopy
  • Electrochemistry
  • Silicon compounds
  • Silicones
  • Coatings
Source: 
http://dx.doi.org/10.1149/1.4704931
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/73842
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.
 

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.