Please use this identifier to cite or link to this item:
http://acervodigital.unesp.br/handle/11449/75385
- Title:
- Enhanced optical properties of germanate and tellurite glasses containing metal or semiconductor nanoparticles
- Universidade Federal de Pernambuco (UFPE)
- Universidade de São Paulo (USP)
- Universidade Estadual Paulista (UNESP)
- 1537-744X
- Germanium- and tellurium-based glasses have been largely studied due to their recognized potential for photonics. In this paper, we review our recent studies that include the investigation of the Stokes and anti-Stokes photoluminescence (PL) in different glass systems containing metallic and semiconductor nanoparticles (NPs). In the case of the samples with metallic NPs, the enhanced PL was attributed to the increased local field on the rare-earth ions located in the proximity of the NPs and/or the energy transfer from the metallic NPs to the rare-earth ions. For the glasses containing silicon NPs, the PL enhancement was mainly due to the energy transfer from the NPs to the Er3+ ions. The nonlinear (NL) optical properties of PbO-GeO 2 films containing gold NPs were also investigated. The experiments in the pico- and subpicosecond regimes revealed enhanced values of the NL refractive indices and large NL absorption coefficients in comparison with the films without gold NPs. The reported experiments demonstrate that germanate and tellurite glasses, having appropriate rare-earth ions doping and NPs concentration, are strong candidates for PL-based devices, all-optical switches, and optical limiting. © 2013 Cid Bartolomeu de Araujo et al.
- 13-May-2013
- The Scientific World Journal, v. 2013.
- germanate
- glass
- gold nanoparticle
- metal nanoparticle
- silicon
- tellurite
- unclassified drug
- germanium
- germanium dioxide
- tellurium
- tellurous acid
- absorption
- energy transfer
- photoluminescence
- photon
- review
- semiconductor
- chemistry
- materials testing
- refractometry
- ultrastructure
- Germanium
- Materials Testing
- Metal Nanoparticles
- Refractometry
- Semiconductors
- Tellurium
- http://dx.doi.org/10.1155/2013/385193
- Acesso aberto
- outro
- http://repositorio.unesp.br/handle/11449/75385
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