Nonlinear control system applied to atomic force microscope including parametric errors

Nozaki, Ricardo; Balthazar, José Manoel; Tusset, Angelo Marcelo; De Pontes Jr., Bento Rodrigues; Bueno, Átila Madureira

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/75502

Title:

Nonlinear control system applied to atomic force microscope including parametric errors

Author(s):

Institution:

Universidade Estadual Paulista (UNESP)
Universidade Tecnológica Federal Do Paraná - UTFPR

ISSN:

2195-3880
2195-3899

Abstract:

The performance of the optimal linear feedback control and of the state-dependent Riccati equation control techniques applied to control and to suppress the chaotic motion in the atomic force microscope are analyzed. In addition, the sensitivity of each control technique regarding to parametric uncertainties are considered. Simulation results show the advantages and disadvantages of each technique. © 2013 Brazilian Society for Automatics - SBA.

Issue Date:

1-Jun-2013

Citation:

Journal of Control, Automation and Electrical Systems, v. 24, n. 3, p. 223-231, 2013.

Time Duration:

223-231

Keywords:

Atomic force microscopy (AFM)
Chaos
Optimal linear feedback control (OLFC)
State-dependent Riccati equation (SDRE)
Atomic force microscope (AFM)
Chaotic motions
Control techniques
Linear feedback control
Parametric errors
Parametric uncertainties
State-dependent Riccati equation
Chaos theory
Feedback control
Optimization
Atomic force microscopy

Source:

http://dx.doi.org/10.1007/s40313-013-0034-1

URI:

Access Rights:

Acesso restrito

Type:

outro

Source:

http://repositorio.unesp.br/handle/11449/75502

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