You are in the accessibility menu

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/76392
Title: 
Optical, mechanical and surface properties of amorphous carbonaceous thin films obtained by plasma enhanced chemical vapor deposition and plasma immersion ion implantation and deposition
Author(s): 
Institution: 
Universidade Estadual Paulista (UNESP)
ISSN: 
0169-4332
Abstract: 
Diverse amorphous hydrogenated carbon-based films (a-C:H, a-C:H:F, a-C:H:N, a-C:H:Cl and a-C:H:Si:O) were obtained by radiofrequency plasma enhanced chemical vapor deposition (PECVD) and plasma immersion ion implantation and deposition (PIIID). The same precursors were used in the production of each pair of each type of film, such as a-C:H, using both PECVD and PIIID. Optical properties, namely the refractive index, n, absorption coefficient, α, and optical gap, ETauc, of these films were obtained via transmission spectra in the ultraviolet-visible near-infrared range (wavelengths from 300 to 3300 nm). Film hardness, elastic modulus and stiffness were obtained as a function of depth using nano-indentation. Surface energy values were calculated from liquid drop contact angle data. Film roughness and morphology were assessed using atomic force microscopy (AFM). The PIIID films were usually thinner and possessed higher refractive indices than the PECVD films. Determined refractive indices are consistent with literature values for similar types of films. Values of ETauc were increased in the PIIID films compared to the PECVD films. An exception was the a-C:H:Si:O films, for which that obtained by PIIID was thicker and exhibited a decreased ETauc. The mechanical properties - hardness, elastic modulus and stiffness - of films produced by PECVD and PIIID generally present small differences. An interesting effect is the increase in the hardness of a-C:H:Cl films from 1.0 to 3.0 GPa when ion implantation is employed. Surface energy correlates well with surface roughness. The implanted films are usually smoother than those obtained by PECVD. ©2013 Elsevier B.V. All rights reserved.
Issue Date: 
1-Sep-2013
Citation: 
Applied Surface Science, v. 280, p. 474-481.
Time Duration: 
474-481
Keywords: 
  • AFM
  • Nano-indentation
  • Optical properties
  • Surface energy
  • Ultraviolet-visible near infrared spectroscopy
  • Absorption co-efficient
  • Carbonaceous thin films
  • Film roughness
  • Near-infrared range
  • Plasma immersion ion implantation and deposition
  • Radio-frequency plasma enhanced chemical vapor deposition
  • Transmission spectrums
  • Amorphous carbon
  • Amorphous silicon
  • Atomic force microscopy
  • Carbon films
  • Deposition
  • Elastic moduli
  • Hardness
  • Interfacial energy
  • Ion implantation
  • Near infrared spectroscopy
  • Plasma enhanced chemical vapor deposition
  • Refractive index
  • Silicon
  • Stiffness
  • Surface roughness
  • Vapors
  • Amorphous films
Source: 
http://dx.doi.org/10.1016/j.apsusc.2013.05.013
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/76392
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.
 

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.