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http://acervodigital.unesp.br/handle/11449/111582
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DC Field | Value | Language |
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dc.contributor.author | Basso Bernardi, Maria Ines | - |
dc.contributor.author | Queiroz Maia, Lauro June | - |
dc.contributor.author | Antonelli, Eduardo | - |
dc.contributor.author | Mesquita, Alexandre | - |
dc.contributor.author | Li, Maximo Siu | - |
dc.contributor.author | Gama, Lucianna | - |
dc.date.accessioned | 2014-12-03T13:08:47Z | - |
dc.date.accessioned | 2016-10-25T20:09:11Z | - |
dc.date.available | 2014-12-03T13:08:47Z | - |
dc.date.available | 2016-10-25T20:09:11Z | - |
dc.date.issued | 2014-03-01 | - |
dc.identifier | http://dx.doi.org/10.1051/epjap/2014130225 | - |
dc.identifier.citation | European Physical Journal-applied Physics. Les Ulis Cedex A: Edp Sciences S A, v. 65, n. 3, 8 p., 2014. | - |
dc.identifier.issn | 1286-0042 | - |
dc.identifier.uri | http://hdl.handle.net/11449/111582 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/111582 | - |
dc.description.abstract | Nanometric Zn1-xCoxO ( x = 0.020, 0.025 and 0.030 in mol.%) nanopowders were obtained from low temperature calcination of a resin prepared using the Pechini's method. Firing the Zn1-xCoxO resin at 400 degrees C/2 h a powder with hexagonal structure was obtained as measured by X-ray diffraction (XRD). The powder presented average particle size of 40 nm observed by field emission scanning electronic microscopy (FE-SEM) micrographs and average crystallite size of 10 nm calculated from the XRD using Scherrer's equation. Nanocrystalline Zn1-xCoxO films with good homogeneity and optical quality were obtained with 280-980 nm thicknesses by electron beam physical vapour deposition (EBPVD) under vacuum onto silica substrate at 25 degrees C. Scanning electron microscopy with field emission gun showed that the film microstructure is composed by spherical grains and some needles. In these conditions of deposition the films presented only hexagonal phase observed by XRD. The UV-visible-NIR and diffuse reflectance properties of the films were measured and the electric properties were calculated using the reflectance and transmittance spectra. | en |
dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | - |
dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) | - |
dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | - |
dc.format.extent | 8 | - |
dc.language.iso | eng | - |
dc.publisher | Edp Sciences S A | - |
dc.source | Web of Science | - |
dc.title | CoO doping effects on the ZnO films through EBPDV technique | en |
dc.type | outro | - |
dc.contributor.institution | Universidade de São Paulo (USP) | - |
dc.contributor.institution | Universidade Federal de Goiás (UFG) | - |
dc.contributor.institution | Universidade Federal de São Paulo (UNIFESP) | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.contributor.institution | Universidade Federal de Campina Grande (UFCG) | - |
dc.description.affiliation | Univ Sao Paulo, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil | - |
dc.description.affiliation | Univ Fed Goias, Inst Fis, BR-74001970 Goiania, Go, Brazil | - |
dc.description.affiliation | Univ Fed Sao Paulo, Inst Ciencia & Tecnol, BR-12231280 Sao Jose Dos Campos, SP, Brazil | - |
dc.description.affiliation | Univ Estadual Paulista, Inst Geociencias & Ciencias Exatas, BR-13506900 Rio Claro, SP, Brazil | - |
dc.description.affiliation | Univ Fed Campina Grande, Dept Engn Mat, BR-58109970 Campina Grande, PB, Brazil | - |
dc.description.affiliationUnesp | Univ Estadual Paulista, Inst Geociencias & Ciencias Exatas, BR-13506900 Rio Claro, SP, Brazil | - |
dc.identifier.doi | 10.1051/epjap/2014130225 | - |
dc.identifier.wos | WOS:000333668000005 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.identifier.file | WOS000333668000005.pdf | - |
dc.relation.ispartof | European Physical Journal-applied Physics | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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