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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/113518
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dc.contributor.authorFonzar Pintao, Carlos Alberto-
dc.date.accessioned2014-12-03T13:11:46Z-
dc.date.accessioned2016-10-25T20:15:04Z-
dc.date.available2014-12-03T13:11:46Z-
dc.date.available2016-10-25T20:15:04Z-
dc.date.issued2014-02-01-
dc.identifierhttp://dx.doi.org/10.1109/TDEI.2013.004062-
dc.identifier.citationIeee Transactions On Dielectrics And Electrical Insulation. Piscataway: Ieee-inst Electrical Electronics Engineers Inc, v. 21, n. 1, p. 311-316, 2014.-
dc.identifier.issn1070-9878-
dc.identifier.urihttp://hdl.handle.net/11449/113518-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/113518-
dc.description.abstractWe have characterized Mylar by determining the emission yield and energy spectrum of emitted secondary electrons. In this study we used a conventional electron accelerator apparatus to which we have made some important adjustments, especially to determine the normalized energy distribution. These adjustments allowed us to obtain the data necessary to calculate reduced yield curves, (delta/delta(M) vs. E/E-M) in which the secondary emission yields and the Energy of the fixed energy beam were both divided by their maximum values. Results for the total emission yield (sigma), backscattered electrons (eta) and true secondary emission electrons (delta) were obtained as a function of the energy of the incident electron beam (E). The results from an experiment where the incident beam was vertically striking a Mylar sample (thickness 36 mu m) are presented. The location of the first and second crossover points, where delta=1, as well as the energy spectrum of secondary electron emission using a planar symmetry arrangement for energies of 1.2 and 1.4 keV were obtained and presented.en
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
dc.format.extent311-316-
dc.language.isoeng-
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)-
dc.sourceWeb of Science-
dc.subjectSecondary electron emissionen
dc.subjectemission yieldsen
dc.subjectelectron beamen
dc.subjectsecondary energy spectrumen
dc.subjectmylaren
dc.subjectreduced yield curvesen
dc.subjectdielectricsen
dc.subjectcrossover pointsen
dc.subjectelectron acceleratoren
dc.subjectpolymersen
dc.titleMylar Secondary Emission-energy Distribution and Yieldsen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniv Estadual Paulista, Dept Fis, Fac Ciencias, BR-17013360 Bauru, SP, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista, Dept Fis, Fac Ciencias, BR-17013360 Bauru, SP, Brazil-
dc.identifier.doi10.1109/TDEI.2013.004062-
dc.identifier.wosWOS:000332038700036-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofIEEE Transactions on Dielectrics and Electrical Insulation-
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