You are in the accessibility menu

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/113535
Full metadata record
DC FieldValueLanguage
dc.contributor.authorPontes, D. S. L.-
dc.contributor.authorCapeli, R. A.-
dc.contributor.authorGarzim, M. L.-
dc.contributor.authorPontes, F. M.-
dc.contributor.authorChiquito, A. J.-
dc.contributor.authorLongo, E.-
dc.date.accessioned2014-12-03T13:11:46Z-
dc.date.accessioned2016-10-25T20:15:06Z-
dc.date.available2014-12-03T13:11:46Z-
dc.date.available2016-10-25T20:15:06Z-
dc.date.issued2014-04-15-
dc.identifierhttp://dx.doi.org/10.1016/j.matlet.2014.01.119-
dc.identifier.citationMaterials Letters. Amsterdam: Elsevier Science Bv, v. 121, p. 93-96, 2014.-
dc.identifier.issn0167-577X-
dc.identifier.urihttp://hdl.handle.net/11449/113535-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/113535-
dc.description.abstractThe ferroelectric and dielectric properties of lead barium strontium titanate (PBST) thin films are investigated on different bottom electrode and substrate such as Pt, LaNiO3 and Pt/Ti/SiO2/Si, LaAlO3(100), respectively. X-ray diffraction results indicate that the PBST and LaNiO3 films on LaAlO3(100) single crystal substrate are highly (100)-oriented whereas the PBST films on Pt/Ti/SiO2/Si are polycrystalline. The results indicate strong effects of bottom electrode on the dielectric permittivity and tunability of the PBST films. The dielectric permittivity and tunability for the highly (100)-oriented PBST films on LaNiO3/LaAlO3(100) structure were 1238% and 65%, respectively, at 100 kHz, while PBST films prepared on PtiTi/SiO2/Si substrate, showed a dielectric permittivity of 520 and tunability of 47%, at 100 kHz. A slight shift of the phase transition temperature to lower temperatures was observed for highly (100)-oriented films in comparison to the polycrystalline films. Electrical properties should depend strongly on orientation and bottom electrode, which is reflected in our experimental observations. (C) 2014 Elsevier B.V. All rights reserved.en
dc.description.sponsorshipFundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP)-
dc.description.sponsorshipConselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq)-
dc.description.sponsorshipCoordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES)-
dc.format.extent93-96-
dc.language.isoeng-
dc.publisherElsevier B.V.-
dc.sourceWeb of Science-
dc.subjectThin filmsen
dc.subjectFerroelectricen
dc.subjectTextureen
dc.subjectChemical solution depositionen
dc.titleStructural, microstructural, optical and electrical properties of (Pb,Ba,Sr)TiO3 films growth on conductive LaNiO3-coated LaAO(3)(100) and Pt/Ti/SiO2/Si substratesen
dc.typeoutro-
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniv Fed Sao Carlos, LIEC Dept Chem, BR-13565905 Sao Paulo, Brazil-
dc.description.affiliationUniv Estadual Paulista, UNESP, Dept Chem, BR-17033360 Sao Paulo, Brazil-
dc.description.affiliationUniv Fed Sao Carlos, NanO LaB, Dept Phys, BR-13565905 Sao Paulo, Brazil-
dc.description.affiliationUniv Estadual Paulista, UNESP, Inst Chem, BR-17033360 Sao Paulo, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista, UNESP, Dept Chem, BR-17033360 Sao Paulo, Brazil-
dc.description.affiliationUnespUniv Estadual Paulista, UNESP, Inst Chem, BR-17033360 Sao Paulo, Brazil-
dc.identifier.doi10.1016/j.matlet.2014.01.119-
dc.identifier.wosWOS:000334084600025-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofMaterials Letters-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.
 

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.