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http://acervodigital.unesp.br/handle/11449/116586
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DC Field | Value | Language |
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dc.contributor.author | Pontes, D. S. L. | - |
dc.contributor.author | Chiquito, A. J. | - |
dc.contributor.author | Pontes, F. M. | - |
dc.contributor.author | Longo, E. | - |
dc.date.accessioned | 2015-03-18T15:53:33Z | - |
dc.date.accessioned | 2016-10-25T20:25:09Z | - |
dc.date.available | 2015-03-18T15:53:33Z | - |
dc.date.available | 2016-10-25T20:25:09Z | - |
dc.date.issued | 2014-10-05 | - |
dc.identifier | http://dx.doi.org/10.1016/j.jallcom.2014.04.132 | - |
dc.identifier.citation | Journal Of Alloys And Compounds. Lausanne: Elsevier Science Sa, v. 609, p. 33-39, 2014. | - |
dc.identifier.issn | 0925-8388 | - |
dc.identifier.uri | http://hdl.handle.net/11449/116586 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/116586 | - |
dc.description.abstract | Ferroelectric thin films and LaNiO3 (LNO) metallic conductive oxide thin films were prepared by a chemical solution deposition (CSD) method. PBCT60, PBST60 and PCST60 ferroelectric thin films were grown on different structures such as LNO/Si and single-crystalline quartz SiO2 (X-cut) substrates. The LNO layer acts as the bottom electrode for the electrical measurements. X-ray diffraction (XRD) analysis shows that LNO thin films on Si substrates and PBCT60, PBST60 and PCST60 thin films on LNO/Si structures are poly-crystalline with a moderate (110)-texture and a complete perovskite phase. LNO, PBCT60, PBST60 and PCST60 thin films have a continuous, dense and homogenous microstructure with a grain size on the order of 50-80 nm. Electrical resistivity-dependence temperature data confirm that LNO thin films display a good metallic character over a wide large range of temperatures. Optical characteristics of PBCT60, PBST60 and PCST60 thin films have also been investigated using ultraviolet-visible (UV-vis) spectroscopy in the wavelength range of 200-1100 nm. Ferroelectric thin films show a direct allowed optical transition with optical band gap values on the of order of 3.54, 3.66 and 3.89 eV for PBCT60, PCST60 and PBST60 thin films deposited on a SiO2 substrate, respectively. Good dielectric and ferroelectric properties are reported for ferroelectric thin films deposited on the LNO layer as bottom electrodes. Au/PBCT60/LNO/Si, Au/PBST60/LNO/Si and Au/PCST60/LNO/Si multilayer structures show a hysteresis loop with remnant polarization, P-r, of 9.6, 6.6 and 4.2 mu C/cm(2) at an applied voltage of 6 V for PBCT60, PBST60 and PCST60 thin films, respectively. (C) 2014 Elsevier B.V. All rights reserved. | en |
dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | - |
dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | - |
dc.description.sponsorship | CEPID/CDMF/INCTMN | - |
dc.format.extent | 33-39 | - |
dc.language.iso | eng | - |
dc.publisher | Elsevier B.V. | - |
dc.source | Web of Science | - |
dc.subject | Thin films | en |
dc.subject | LaNiO3 | en |
dc.subject | Electrical properties | en |
dc.subject | Chemical solution deposition | en |
dc.title | Structural, dielectric, ferroelectric and optical properties of PBCT, PBST and PCST complex thin films on LaNiO3 metallic conductive oxide layer coated Si substrates by the CSD technique | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Federal de São Carlos (UFSCar) | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Univ Fed Sao Carlos, CDMF, LIEC, Dept Chem, BR-13565905 Sao Carlos, SP, Brazil | - |
dc.description.affiliation | Univ Fed Sao Carlos, Dept Phys, NanO LaB, BR-13565905 Sao Carlos, SP, Brazil | - |
dc.description.affiliation | Univ Estadual Paulista, UNESP, Dept Chem, BR-17033360 Bauru, SP, Brazil | - |
dc.description.affiliation | Univ Estadual Paulista, UNESP, CDMF, LIEC,Inst Chem, Araraquara, SP, Brazil | - |
dc.description.affiliationUnesp | Univ Estadual Paulista, UNESP, Dept Chem, BR-17033360 Bauru, SP, Brazil | - |
dc.description.affiliationUnesp | Univ Estadual Paulista, UNESP, CDMF, LIEC,Inst Chem, Araraquara, SP, Brazil | - |
dc.description.sponsorshipId | FAPESP: 08/57150-6 | - |
dc.description.sponsorshipId | FAPESP: 11/20536-7 | - |
dc.description.sponsorshipId | FAPESP: 13/07296-2 | - |
dc.identifier.doi | 10.1016/j.jallcom.2014.04.132 | - |
dc.identifier.wos | WOS:000336606000006 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | Journal Of Alloys And Compounds | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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