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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/130184
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dc.contributor.authorMachado, Diego Henrique de Oliveira-
dc.contributor.authorFloriano, Emerson Aparecido-
dc.contributor.authorScalvi, Luis Vicente de Andrade-
dc.contributor.authorSaeki, Margarida Juri-
dc.date.accessioned2015-11-03T15:30:01Z-
dc.date.accessioned2016-10-25T21:18:40Z-
dc.date.available2015-11-03T15:30:01Z-
dc.date.available2016-10-25T21:18:40Z-
dc.date.issued2014-01-01-
dc.identifierhttp://www.scientific.net/AMR.975.201-
dc.identifier.citationElectroceramics Vi. Stafa-zurich: Trans Tech Publications Ltd, v. 975, p. 201-206, 2014.-
dc.identifier.issn1022-6680-
dc.identifier.urihttp://hdl.handle.net/11449/130184-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/130184-
dc.description.abstractTiO2/SnO2 thin films heterostructures were grown by the sol-gel dip-coating technique. It was found that the crystalline structure of TiO2 depends on the annealing temperature and the substrate type. TiO2 films deposited on glass substrate, submitted to thermal annealing until 550 degrees C, present anatase structure, whereas films deposited on quartz substrate transform to rutile structure when thermally annealed at 1100 degrees C. When structured as rutile, this oxide semiconductor has very close lattice parameters to those of SnO2, making easier the heterostructure assembling. The electrical properties of TiO2/SnO2 heterostructure were evaluated as function of temperature and excitation with different light sources. The temperature dependence of conductivity is dominated by a deep level with energy coincident with the second ionization level of oxygen vacancies in SnO2, suggesting the dominant role of the most external layer material (SnO2) to the electrical transport properties. The fourth harmonic of a Nd:YAG laser line (4.65 eV) seems to excite the most external layer whereas a InGaN LED (2.75 eV) seems to excite electrons from the ground state of a quantized interfacial channel as well as intrabandgap states of the TiO2 layer.en
dc.format.extent201-206-
dc.language.isoeng-
dc.publisherTrans Tech Publications Ltd-
dc.sourceWeb of Science-
dc.subjectTin dioxideen
dc.subjectTitanium dioxideen
dc.subjectHeterostructureen
dc.subjectGas sensorsen
dc.subjectElectrical propertiesen
dc.titleInvestigation of photoinduced electrical properties in the heterojunction TiO2/SnO2en
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUnespUniversidade Estadual Paulista, Departamento de Física, Faculdade de Ciências de Bauru-
dc.description.affiliationUnespUniversidade Estadual Paulista, Departamento de Química e Bioquímica, Instituto de Biociências de Botucatu-
dc.identifier.doihttp://dx.doi.org/10.4028/www.scientific.net/AMR.975.201-
dc.identifier.wosWOS:000348023200033-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofElectroceramics Vi-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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