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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/130546
Title: 
Subband mixing inducing negative resistance
Author(s): 
Institution: 
  • Universidade de São Paulo (USP)
  • Universidade Estadual Paulista (UNESP)
ISSN: 
0038-1098
Abstract: 
A new double channel field-effect structure based on delta-doping technology is proposed Resonant tunneling between the channels is employed to control the transport along the interface plane. A realistic simulation is performed for several temperatures. We solve the Schrodinger and Poisson equations self-consistently and have found that a large peak-to-valley ratio in the current-voltage characteristic occurs at the whole range of temperature investigated this effect indicates the potential application of this phenomenon for switching devices, where the transversal conductivity can be controlled due to the coupling between states belonging to different channels.
Issue Date: 
1-May-1993
Citation: 
Solid State Communications, v. 86, n. 5, p. 301-304, 1993.
Time Duration: 
301-304
Publisher: 
Elsevier B.V.
Keywords: 
  • Doping (additives)
  • Negative resistance
  • Switching circuits
  • Double channel field-effect structures
  • Resonant tunneling
  • Subband mixing
  • Field effect semiconductor devices
Source: 
http://dx.doi.org/10.1016/0038-1098(93)90377-Y
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/130546
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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