You are in the accessibility menu

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/130571
Full metadata record
DC FieldValueLanguage
dc.contributor.authorMarcal, Luiz A. P.-
dc.contributor.authorGaleti, Jose Henrique-
dc.contributor.authorHiguti, Ricardo T.-
dc.contributor.authorKitano, Claudio-
dc.contributor.authorSilva, Emilio C. N.-
dc.date.accessioned2014-05-27T11:27:18Z-
dc.date.accessioned2016-10-25T21:21:29Z-
dc.date.available2015-11-16T15:25:46Z-
dc.date.available2016-10-25T21:21:29Z-
dc.date.issued2012-12-01-
dc.identifierhttp://dx.doi.org/10.1109/INDUSCON.2012.6452451-
dc.identifier.citation2012 10th IEEE/ias International Conference on Industry Applications (induscon). New York: IEEE, p. 6, 2012.-
dc.identifier.urihttp://hdl.handle.net/11449/130571-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/130571-
dc.description.abstractIn this work, nanometric displacement amplitudes of a Piezoelectric Flextensional Actuator (PFA) designed using the topology optimization technique and operating in its linear range are measured by using a homodyne Michelson interferometer. A new improved version of the J1...J4 method for optical phase measurements, named J1...J5 method, is presented, which is of easier implementation than the original one. This is a passive phase detection scheme, unaffected by signal fading, source instabilities and changes in visibility. Experimental results using this improvement were compared with those obtained by using the J1... J4, J1...J6(pos) and J1...J 6(neg) methods, concluding that the dynamic range is increased while maintaining the sensitivity. Analysis based on the 1/f voltage noise and random fading show the new method is more stable to phase drift than all those methods. © 2012 IEEE.en
dc.format.extent6-
dc.language.isoeng-
dc.publisherIEEE-
dc.sourceScopus-
dc.subjectDynamic range-
dc.subjectFlextensional actuator-
dc.subjectHomodynes-
dc.subjectInterferometric measurement-
dc.subjectLinear range-
dc.subjectNanometric displacements-
dc.subjectOptimization techniques-
dc.subjectPassive phase-
dc.subjectPhase drift-
dc.subjectSignal fading-
dc.subjectVoltage noise-
dc.subjectActuators-
dc.subjectIndustrial applications-
dc.subjectMichelson interferometers-
dc.subjectSensitivity analysis-
dc.subjectPiezoelectricity-
dc.titleInterferometric measurements of nanometric displacements in a Piezoelectric Flextensional Actuator by using the new J1...J5 methoden
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.description.affiliationDepartment of Electrical Engineering Universidade Estadual Paulista - UNESP., Ilha Solteira, SP-
dc.description.affiliationDepartment of Mechatronics and Mechanical Systems Engineering Escola Politécnica da Universidade de São Paulo - EPUSP, São Paulo-
dc.description.affiliationUnespDepartment of Electrical Engineering Universidade Estadual Paulista - UNESP., Ilha Solteira, SP-
dc.identifier.doi10.1109/INDUSCON.2012.6452451-
dc.identifier.wosWOS:000318021500043-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartof2012 10th IEEE/IAS International Conference on Industry Applications, INDUSCON 2012-
dc.identifier.scopus2-s2.0-84874438910-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.
 

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.