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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/130721
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dc.contributor.authorAstorga, Oscar Armando Maldonado-
dc.contributor.authordo Prado, Afonso Jose-
dc.date.accessioned2014-05-27T11:17:58Z-
dc.date.accessioned2016-10-25T21:21:52Z-
dc.date.available2014-05-27T11:17:58Z-
dc.date.available2016-10-25T21:21:52Z-
dc.date.issued1994-12-01-
dc.identifierhttp://dx.doi.org/10.1109/ELINSL.1994.401397-
dc.identifier.citationConference Record of IEEE International Symposium on Electrical Insulation, p. 546-549.-
dc.identifier.issn0164-2006-
dc.identifier.urihttp://hdl.handle.net/11449/130721-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/130721-
dc.description.abstractResults of the analysis of dynamic behavior of flashover phenomenon on the high voltage-polluted insulators are presented. These results were taken from a mathematical and an experimental model that introduce the variable thickness influence of the layer pollution deposited on the high-voltage insulator surface. Analysis of the flashover was done by way of introducing a variation in the thickness of the channel of Obenaus' model, simulating a layer pollution of variable thickness. The objective was to obtain a better reproduction of the real layer pollution deposited on the insulator that works in the polluted regions. Two types of thickness variations were used: a sudden variation, using a step; and a soft variation, using a ramp; that were put along the way of the discharge. Comparison between the mathematical and experimental models showed that introduction of a ramp makes Obenaus' model more efficient in analyzing behavior of flashover phenomenon.en
dc.format.extent546-549-
dc.language.isoeng-
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)-
dc.sourceScopus-
dc.subjectAlgorithms-
dc.subjectComputer simulation-
dc.subjectElectric discharges-
dc.subjectEquivalent circuits-
dc.subjectGeometry-
dc.subjectMathematical models-
dc.subjectFlashover phenomenon-
dc.subjectHigh voltage polluted insulators-
dc.subjectObenaus model-
dc.subjectRamp-
dc.subjectStep-
dc.subjectVoltage polarity-
dc.subjectElectric insulators-
dc.titleFlashover phenomenon: an analysis with influence of the thickness of the layer pollution of the high voltage polluted insulatorsen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUNESP,FEIS,DEPT ENGN ELETR,BR-15378000 ILHA SOLTEIRA,SP,BRAZIL-
dc.description.affiliationUnespUNESP,FEIS,DEPT ENGN ELETR,BR-15378000 ILHA SOLTEIRA,SP,BRAZIL-
dc.identifier.doi10.1109/ELINSL.1994.401397-
dc.identifier.wosWOS:A1994BA96P00132-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofConference Record of IEEE International Symposium on Electrical Insulation-
dc.identifier.scopus2-s2.0-0028564615-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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