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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/25382
Title: 
Impact of oxygen atmosphere on piezoelectric properties of CaBi2Nb2O9 thin films
Author(s): 
Institution: 
  • Universidade Estadual Paulista (UNESP)
  • Universidade Federal de São Carlos (UFSCar)
  • Georgia Inst Technol
ISSN: 
1359-6454
Abstract: 
CaBi2Nb2O9 (CBNO) thin films were deposited on platinum-coated silicon substrates by the polymeric precursor method, and were annealed in air and in an oxygen atmosphere. The structure, surface morphology and electrical properties of CBNO thin films have been investigated. The presence of an oxygen atmosphere during crystallization of the films affected the structure perfection and morphology, as well as ferroelectric and piezoelectric properties. A reduction in P-r and piezoelectric coefficient, an increase of V-c and displacement of the Curie point is evident in the films crystallized in an oxygen atmosphere. The impact of exposure to the oxygen atmosphere on the creation of defects caused by bismuth and oxygen vacancies between layers was also investigated by X-ray photoelectron spectroscopy. (c) 2007 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Issue Date: 
1-Aug-2007
Citation: 
Acta Materialia. Oxford: Pergamon-Elsevier B.V., v. 55, n. 14, p. 4707-4712, 2007.
Time Duration: 
4707-4712
Publisher: 
Elsevier B.V.
Keywords: 
  • piezoelectricity
  • vacancies
  • point defects
  • CaBi2Nb2O9
  • x-ray photoelectron spectroscopy
Source: 
http://dx.doi.org/10.1016/j.actamat.2007.04.030
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/25382
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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