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http://acervodigital.unesp.br/handle/11449/25672Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Simões, Alexandre Zirpoli | - |
| dc.contributor.author | Riccardi, C. S. | - |
| dc.date.accessioned | 2014-05-20T14:18:47Z | - |
| dc.date.accessioned | 2016-10-25T17:40:44Z | - |
| dc.date.available | 2014-05-20T14:18:47Z | - |
| dc.date.available | 2016-10-25T17:40:44Z | - |
| dc.date.issued | 2009-01-01 | - |
| dc.identifier | http://dx.doi.org/10.1155/2009/928545 | - |
| dc.identifier.citation | Advances In Materials Science and Engineering. New York: Hindawi Publishing Corporation, p. 6, 2009. | - |
| dc.identifier.issn | 1687-6822 | - |
| dc.identifier.uri | http://hdl.handle.net/11449/25672 | - |
| dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/25672 | - |
| dc.description.abstract | SrBi4Ti4O15 (SBTi) thin films were deposited by the polymeric precursor method on Pt bottom electrodes. The obtained films were characterized by X-ray diffraction, scanning electron microscopy, Raman spectroscopy, and dielectric spectroscopy analyses. The capacitance-voltage (C-V) characteristics of perovskite thin film showed normal ferroelectric behavior. The remanent polarization and coercive fields were 5.4 mu C/cm(2) and 85 kV/cm, respectively. Dielectric spectroscopy was employed to examine the polycrystalline behavior of ferroelectric material and the mechanisms responsible for the dielectric performance of the thin film. Copyright (C) 2009 A. Z. Simoes and C. S. Riccardi. | en |
| dc.description.sponsorship | Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) | - |
| dc.description.sponsorship | Conselho Nacional de Desenvolvimento Científico e Tecnológico (CNPq) | - |
| dc.description.sponsorship | Coordenação de Aperfeiçoamento de Pessoal de Nível Superior (CAPES) | - |
| dc.format.extent | 6 | - |
| dc.language.iso | eng | - |
| dc.publisher | Hindawi Publishing Corporation | - |
| dc.source | Web of Science | - |
| dc.title | Dielectric Spectroscopy Analyses of SrBi4Ti4O15 Films Obtained from Soft Chemical Solution | en |
| dc.type | outro | - |
| dc.contributor.institution | Universidade Federal de Itajubá (UNIFEI) | - |
| dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
| dc.description.affiliation | Univ Fed Itajuba Unifei, BR-3590037 Itabira, MG, Brazil | - |
| dc.description.affiliation | Univ Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14800900 Araraquara, SP, Brazil | - |
| dc.description.affiliationUnesp | Univ Estadual Paulista, Inst Quim, Dept Quim Fis, Lab Interdisciplinar Ceram, BR-14800900 Araraquara, SP, Brazil | - |
| dc.identifier.doi | 10.1155/2009/928545 | - |
| dc.identifier.wos | WOS:000207891900001 | - |
| dc.rights.accessRights | Acesso aberto | - |
| dc.identifier.file | WOS000207891900001.pdf | - |
| dc.relation.ispartof | Advances In Materials Science and Engineering | - |
| Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp | |
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