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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/31172
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dc.contributor.authorYacoub, M. D.-
dc.contributor.authorda Silva, CRCM-
dc.contributor.authorVargas, J. E.-
dc.date.accessioned2014-05-20T15:19:47Z-
dc.date.accessioned2016-10-25T17:52:41Z-
dc.date.available2014-05-20T15:19:47Z-
dc.date.available2016-10-25T17:52:41Z-
dc.date.issued2000-02-17-
dc.identifierhttp://dx.doi.org/10.1049/el:20000288-
dc.identifier.citationElectronics Letters. Hertford: IEE-inst Elec Eng, v. 36, n. 4, p. 382-384, 2000.-
dc.identifier.issn0013-5194-
dc.identifier.urihttp://hdl.handle.net/11449/31172-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/31172-
dc.description.abstractExact and closed-form expressions for the level crossing rate and average fade duration are presented for equal gain combining and maximal ratio combining schemes, assuming an arbitrary number of independent branches in a Rayleigh environment. The analytical results are thoroughly validated by simulation.en
dc.format.extent382-384-
dc.language.isoeng-
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)-
dc.sourceWeb of Science-
dc.titleSecond-order statistics for equal gain and maximal ratio diversity-combining receptionen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual de Campinas (UNICAMP)-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationUniv Estadual Campinas, Sch Elect & Comp Engn, BR-13083970 Campinas, SP, Brazil-
dc.description.affiliationState Univ São Paulo, Dept Elect Engn, Guaratingueta, SP, Brazil-
dc.description.affiliationUnespState Univ São Paulo, Dept Elect Engn, Guaratingueta, SP, Brazil-
dc.identifier.doi10.1049/el:20000288-
dc.identifier.wosWOS:000085671500066-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofElectronics Letters-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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