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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/31595
Title: 
Joint (X)over-bar and R charts with variable sample sizes and sampling intervals
Author(s): 
Costa, AFB
Institution: 
Universidade Estadual Paulista (UNESP)
ISSN: 
0022-4065
Abstract: 
Recent studies have shown that the (X) over bar chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional (X) over bar chart. This article extends these studies for processes that are monitored by both the (X) over bar and R charts. A Markov chain model is used to determine the properties of the joint (X) over bar and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint (X) over bar and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.
Issue Date: 
1-Oct-1999
Citation: 
Journal of Quality Technology. Milwaukee: Amer Soc Quality Control-asqc, v. 31, n. 4, p. 387-397, 1999.
Time Duration: 
387-397
Publisher: 
Amer Soc Quality Control-asqc
Source: 
http://asq.org/qic/display-item/?item=13851
URI: 
Access Rights: 
Acesso restrito
Type: 
outro
Source:
http://repositorio.unesp.br/handle/11449/31595
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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