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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/31595
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dc.contributor.authorCosta, AFB-
dc.date.accessioned2014-05-20T15:20:16Z-
dc.date.accessioned2016-10-25T17:53:20Z-
dc.date.available2014-05-20T15:20:16Z-
dc.date.available2016-10-25T17:53:20Z-
dc.date.issued1999-10-01-
dc.identifierhttp://asq.org/qic/display-item/?item=13851-
dc.identifier.citationJournal of Quality Technology. Milwaukee: Amer Soc Quality Control-asqc, v. 31, n. 4, p. 387-397, 1999.-
dc.identifier.issn0022-4065-
dc.identifier.urihttp://hdl.handle.net/11449/31595-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/31595-
dc.description.abstractRecent studies have shown that the (X) over bar chart with variable sampling intervals (VSI) and/or with variable sample sizes (VSS) detects process shifts faster than the traditional (X) over bar chart. This article extends these studies for processes that are monitored by both the (X) over bar and R charts. A Markov chain model is used to determine the properties of the joint (X) over bar and R charts with variable sample sizes and sampling intervals (VSSI). The VSSI scheme improves the joint (X) over bar and R control chart performance in terms of the speed with which shifts in the process mean and/or variance are detected.en
dc.format.extent387-397-
dc.language.isoeng-
dc.publisherAmer Soc Quality Control-asqc-
dc.sourceWeb of Science-
dc.titleJoint (X)over-bar and R charts with variable sample sizes and sampling intervalsen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.description.affiliationSão Paulo State Univ, UNESP, Dept Prod, BR-12500000 Guaratingueta, Brazil-
dc.description.affiliationUnespSão Paulo State Univ, UNESP, Dept Prod, BR-12500000 Guaratingueta, Brazil-
dc.identifier.wosWOS:000083162800003-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofJournal of Quality Technology-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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