You are in the accessibility menu

Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/32563
Full metadata record
DC FieldValueLanguage
dc.contributor.authorGiacometti, J. A.-
dc.contributor.authorWisniewski, C.-
dc.contributor.authorRibeiro, P. A.-
dc.contributor.authorMoura, W. A.-
dc.date.accessioned2014-05-20T15:21:25Z-
dc.date.accessioned2016-10-25T17:54:50Z-
dc.date.available2014-05-20T15:21:25Z-
dc.date.available2016-10-25T17:54:50Z-
dc.date.issued2001-11-01-
dc.identifierhttp://dx.doi.org/10.1063/1.1409564-
dc.identifier.citationReview of Scientific Instruments. Melville: Amer Inst Physics, v. 72, n. 11, p. 4223-4227, 2001.-
dc.identifier.issn0034-6748-
dc.identifier.urihttp://hdl.handle.net/11449/32563-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/32563-
dc.description.abstractThis article assesses the use of the constant current (CC) method for characterizing dielectric films. The method is based on charging the sample with a constant current (current stress) and measuring the corresponding voltage rise under the closed circuit condition. Our article shows that the CC method is an alternative to the constant voltage stressing method to study the electric properties of nonpolar, ferroelectric, and polar polymers. The method was tested by determining the dielectric constant of polytetrafluoroethylene, and investigating the electric conduction in poly(ethylene terephthalate). For the ferroelectric polymer poly(vinylidene fluoride), it is shown that hysteresis loops and the dependence of the ferroelectric polarization on the electric field can be obtained. (C) 2001 American Institute of Physics.en
dc.format.extent4223-4227-
dc.language.isoeng-
dc.publisherAmerican Institute of Physics (AIP)-
dc.sourceWeb of Science-
dc.titleElectric measurements with constant current: A practical method for characterizing dielectric filmsen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.contributor.institutionUniv Nova Lisboa-
dc.description.affiliationUniv Estadual Paulista, Fac Ciências & Tecnol, BR-10060900 Presidente Prudente, SP, Brazil-
dc.description.affiliationUniv São Paulo, Inst Fis Sao Carlos, BR-13566970 Sao Carlos, SP, Brazil-
dc.description.affiliationUniv Nova Lisboa, Fac Ciências & Tecnol, Dept Fis, CeFITec, P-2825114 Caparica, Portugal-
dc.description.affiliationUnespUniv Estadual Paulista, Fac Ciências & Tecnol, BR-10060900 Presidente Prudente, SP, Brazil-
dc.identifier.doi10.1063/1.1409564-
dc.identifier.wosWOS:000171797000028-
dc.rights.accessRightsAcesso restrito-
dc.identifier.fileWOS000171797000028.pdf-
dc.relation.ispartofReview of Scientific Instruments-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

There are no files associated with this item.
 

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.