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Please use this identifier to cite or link to this item: http://acervodigital.unesp.br/handle/11449/32653
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dc.contributor.authorVasconcelos, NSLS-
dc.contributor.authorVasconcelos, J. S.-
dc.contributor.authorBouquet, V-
dc.contributor.authorZanetti, S. M.-
dc.contributor.authorLeite, E. R.-
dc.contributor.authorLongo, Elson-
dc.contributor.authorSoledade, LEB-
dc.contributor.authorPontes, F. M.-
dc.contributor.authorGuilloux-Viry, M.-
dc.contributor.authorPerrin, A.-
dc.contributor.authorBernardi, M. I.-
dc.contributor.authorVarela, José Arana-
dc.date.accessioned2014-05-20T15:21:31Z-
dc.date.accessioned2016-10-25T17:54:58Z-
dc.date.available2014-05-20T15:21:31Z-
dc.date.available2016-10-25T17:54:58Z-
dc.date.issued2003-07-31-
dc.identifierhttp://dx.doi.org/10.1016/S0040-6090(03)00587-X-
dc.identifier.citationThin Solid Films. Lausanne: Elsevier B.V. Sa, v. 436, n. 2, p. 213-219, 2003.-
dc.identifier.issn0040-6090-
dc.identifier.urihttp://hdl.handle.net/11449/32653-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/32653-
dc.description.abstractOriented LiNbO3 thin films were prepared using a polymeric precursor solution deposited on (0001) sapphire substrate by spin coating and crystallized in a microwave oven. Crystallization of the films was carried out in a domestic microwave oven. The influence of this type of heat treatment on the film orientation was analyzed by X-ray diffraction and electron channeling patterns, which revealed epitaxial growth of films crystallized at 550 and 650 degreesC for 10 min. A microstructural study indicated that the films treated at temperatures below 600 degreesC were homogeneous and dense, and the optical properties confirmed the good quality of these films. (C) 2003 Elsevier B.V. B.V. All rights reserved.en
dc.format.extent213-219-
dc.language.isoeng-
dc.publisherElsevier B.V.-
dc.sourceWeb of Science-
dc.subjectepitaxypt
dc.subjectthin filmspt
dc.subjectmicrowavept
dc.subjectoptical propertiespt
dc.titleEpitaxial growth of LiNbO3 thin films in a microwave ovenen
dc.typeoutro-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)-
dc.contributor.institutionCentro Federal de Educação Tecnológica (CEFET)-
dc.contributor.institutionUniv Rennes 1-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.description.affiliationUNESP, CMDMC, LIEC, Inst Quim, BR-14801907 Araraquara, SP, Brazil-
dc.description.affiliationUniv Fed Sao Carlos, CMDMC, LIEC, Dept Quim, BR-13565 Sao Carlos, Brazil-
dc.description.affiliationCEFET MA, Dept Quim, BR-65025001 Sao Luis, MA, Brazil-
dc.description.affiliationCEFET MA, Dept Eletro Eletron, BR-65025001 Sao Luis, MA, Brazil-
dc.description.affiliationUniv Rennes 1, LCSIM, Inst Chim Renne, F-35042 Rennes, France-
dc.description.affiliationUniv São Paulo, Inst Fis, CMDMC, GCCMC, Sao Carlos, SP, Brazil-
dc.description.affiliationUnespUNESP, CMDMC, LIEC, Inst Quim, BR-14801907 Araraquara, SP, Brazil-
dc.identifier.doi10.1016/S0040-6090(03)00587-X-
dc.identifier.wosWOS:000183945700011-
dc.rights.accessRightsAcesso restrito-
dc.relation.ispartofThin Solid Films-
Appears in Collections:Artigos, TCCs, Teses e Dissertações da Unesp

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