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dc.contributor.authorMessaddeq, S. H.-
dc.contributor.authorLi, M. S.-
dc.contributor.authorLezal, D.-
dc.contributor.authorMessaddeq, Younes-
dc.contributor.authorRibeiro, SJL-
dc.contributor.authorOliveira, LFC-
dc.contributor.authorRollo, JMDA-
dc.date.accessioned2014-05-20T15:22:17Z-
dc.date.accessioned2016-10-25T17:55:56Z-
dc.date.available2014-05-20T15:22:17Z-
dc.date.available2016-10-25T17:55:56Z-
dc.date.issued2001-06-01-
dc.identifierhttp://www.dtic.mil/dtic/tr/fulltext/u2/p011514.pdf-
dc.identifier.citationJournal of Optoelectronics and Advanced Materials. Bucharest-magurele: Natl Inst Optoelectronics, v. 3, n. 2, p. 295-302, 2001.-
dc.identifier.issn1454-4164-
dc.identifier.urihttp://hdl.handle.net/11449/33295-
dc.identifier.urihttp://acervodigital.unesp.br/handle/11449/33295-
dc.description.abstractThe influence of time exposure, when exposed to above band gap light (3,52 eV) and annealing, on Ga10Ge25S65 glasses has been studied through their effects on the structure and optical properties. To evaluate the photostructural change infrared and Raman spectra for bulk Ga10Ge25S65 glasses have been measured before and after exposure. The Raman spectra are interpreted in terms of models in which the Ge atoms are fourfold coordinated and the S atoms are two fold coordinated. The observed changes in the spectral region of (S-S) stretching vibration (470-490 cm (-1)) is a direct evidence for the occurrence of important structural changes in local bonding configuration caused by optical irradiation. It is shown that the dominant photostrucural changes are chain formation tendency of the chalcogenide atoms under the laser irradiation rather than rings.en
dc.format.extent295-302-
dc.language.isoeng-
dc.publisherNatl Inst Optoelectronics-
dc.sourceWeb of Science-
dc.subjectchalcogenidept
dc.subjectphotoexpansionpt
dc.subjectRaman spectrapt
dc.subjectGaGeS bulk glasspt
dc.titleRaman investigation of structural photoinduced irreversible changes of Ga10Ge25S65 chalcogenide glassesen
dc.typeoutro-
dc.contributor.institutionUniversidade Federal de São Carlos (UFSCar)-
dc.contributor.institutionASCR-
dc.contributor.institutionICT-
dc.contributor.institutionUniversidade Estadual Paulista (UNESP)-
dc.contributor.institutionUniversidade Federal de Juiz de Fora (UFJF)-
dc.contributor.institutionUniversidade de São Paulo (USP)-
dc.description.affiliationUniv Fed Sao Carlos, Inst Fis Sao Carlos, BR-13560970 Sao Carlos, SP, Brazil-
dc.description.affiliationASCR, IIC, Lab Inorgan Mat, Prague 6, Czech Republic-
dc.description.affiliationICT, Prague 6, Czech Republic-
dc.description.affiliationUNESP, Inst Quim, BR-14801970 Araraquara, SP, Brazil-
dc.description.affiliationUniv Fed Juiz de Fora, Dept Quim, Juiz de Fora, MG, Brazil-
dc.description.affiliationUniv São Paulo, Escola Engn Sao Carlos, BR-13560970 São Paulo, Brazil-
dc.description.affiliationUnespUNESP, Inst Quim, BR-14801970 Araraquara, SP, Brazil-
dc.identifier.wosWOS:000169586800015-
dc.rights.accessRightsAcesso aberto-
dc.relation.ispartofJournal of Optoelectronics and Advanced Materials-
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