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http://acervodigital.unesp.br/handle/11449/34201
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DC Field | Value | Language |
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dc.contributor.author | Simoes, A. Z. | - |
dc.contributor.author | Ramirez, M. A. | - |
dc.contributor.author | Riccardi, C. S. | - |
dc.contributor.author | Longo, Elson | - |
dc.contributor.author | Varela, José Arana | - |
dc.date.accessioned | 2014-05-20T15:23:25Z | - |
dc.date.accessioned | 2016-10-25T17:57:21Z | - |
dc.date.available | 2014-05-20T15:23:25Z | - |
dc.date.available | 2016-10-25T17:57:21Z | - |
dc.date.issued | 2007-04-01 | - |
dc.identifier | http://dx.doi.org/10.1007/s10832-007-9006-9 | - |
dc.identifier.citation | Journal of Electroceramics. Dordrecht: Springer, v. 18, n. 1-2, p. 39-43, 2007. | - |
dc.identifier.issn | 1385-3449 | - |
dc.identifier.uri | http://hdl.handle.net/11449/34201 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/34201 | - |
dc.description.abstract | c-axis oriented Bi3.25La0.75Ti3O12 (BLT) thin films were grown on a RuO2 top electrode deposited on a (100) SiO2/Si substrate by the polymeric precursor method. X-ray diffraction and atomic force microscope investigations indicate that the films exhibit a dense, well crystallized microstructure having random orientations with a rather smooth surface morphology. The electrical properties of preferred oriented Bi3.25La0.75Ti3O12 (BLT) thin films deposited on RuO2 bottom electrode leaded to a large remnant polarization (P-r ) of 17.2 mu C/cm(2) and (V-c ) of 1.8 V, fatigue free characteristics up to 10(10) switching cycles and a current density of 2.2 mu A/cm(2) at 5 V. We found that the polarization loss is insignificant with nine write/read voltages at a waiting time of 10,000 s. Independently of the applied electric field the retained switchable polarization approached a nearly steady-state value after a retention time of 10 s. | en |
dc.format.extent | 39-43 | - |
dc.language.iso | eng | - |
dc.publisher | Springer | - |
dc.source | Web of Science | - |
dc.subject | thin films | pt |
dc.subject | atomic force microscopy | pt |
dc.subject | dielectric properties | pt |
dc.subject | fatigue | pt |
dc.title | Oriented growth of Bi3.25La0.75Ti3O12 thin films on RuO2/SiO2/Si substrates by using the polymeric precursor method: Structural, microstructural and electrical properties | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.contributor.institution | Universidade Federal de São Carlos (UFSCar) | - |
dc.description.affiliation | Univ Estadual Paulista, UNESP, Inst Chem, BR-14801970 Araraquara, SP, Brazil | - |
dc.description.affiliation | Univ Fed Sao Carlos, Dept Chem, BR-13560905 Sao Carlos, SP, Brazil | - |
dc.description.affiliation | Univ Estadual Paulista, UNESP, BR-1703336 Bauru, SP, Brazil | - |
dc.description.affiliationUnesp | Univ Estadual Paulista, UNESP, Inst Chem, BR-14801970 Araraquara, SP, Brazil | - |
dc.description.affiliationUnesp | Univ Estadual Paulista, UNESP, BR-1703336 Bauru, SP, Brazil | - |
dc.identifier.doi | 10.1007/s10832-007-9006-9 | - |
dc.identifier.wos | WOS:000245888700006 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | Journal of Electroceramics | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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