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DC Field | Value | Language |
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dc.contributor.author | Yacoub, M. D. | - |
dc.contributor.author | da Silva, CRCM | - |
dc.contributor.author | Bautista, JEV | - |
dc.date.accessioned | 2014-05-20T15:24:07Z | - |
dc.date.accessioned | 2016-10-25T17:58:14Z | - |
dc.date.available | 2014-05-20T15:24:07Z | - |
dc.date.available | 2016-10-25T17:58:14Z | - |
dc.date.issued | 2001-11-01 | - |
dc.identifier | http://dx.doi.org/10.1109/25.966577 | - |
dc.identifier.citation | IEEE Transactions on Vehicular Technology. New York: IEEE-Inst Electrical Electronics Engineers Inc., v. 50, n. 6, p. 1464-1470, 2001. | - |
dc.identifier.issn | 0018-9545 | - |
dc.identifier.uri | http://hdl.handle.net/11449/34775 | - |
dc.identifier.uri | http://acervodigital.unesp.br/handle/11449/34775 | - |
dc.description.abstract | Exact and closed-form expressions for the level crossing rate and average fade duration are presented for the M branch pure selection combining (PSC), equal gain combining (EGC), and maximal ratio combining (MRC) techniques, assuming independent branches in a Nakagami environment. The analytical results are thoroughly validated by reducing the general case to some special cases, for which the solutions are known, and by means of simulation for the more general case. The model developed here is general and can be easily applied to other fading statistics (e.g., Rice). | en |
dc.format.extent | 1464-1470 | - |
dc.language.iso | eng | - |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | - |
dc.source | Web of Science | - |
dc.subject | average fading duration | pt |
dc.subject | diversity-combining techniques | pt |
dc.subject | level crossing rate | pt |
dc.subject | Nakagami-fading channels | pt |
dc.title | Second-order statistics for diversity-combining, techniques in Nakagami-fading channels | en |
dc.type | outro | - |
dc.contributor.institution | Universidade Estadual de Campinas (UNICAMP) | - |
dc.contributor.institution | Universidade Estadual Paulista (UNESP) | - |
dc.description.affiliation | Univ Estadual Campinas, Sch Elect & Comp Engn, BR-13083970 Campinas, SP, Brazil | - |
dc.description.affiliation | State Univ São Paulo, BR-12500000 Guaratingueta, SP, Brazil | - |
dc.description.affiliationUnesp | State Univ São Paulo, BR-12500000 Guaratingueta, SP, Brazil | - |
dc.identifier.doi | 10.1109/25.966577 | - |
dc.identifier.wos | WOS:000172302900013 | - |
dc.rights.accessRights | Acesso restrito | - |
dc.relation.ispartof | IEEE Transactions on Vehicular Technology | - |
Appears in Collections: | Artigos, TCCs, Teses e Dissertações da Unesp |
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